ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,586, issued on May 19, was assigned to University of Utah Research Foundation (Salt Lake City) and GENTEX Corp. (Zeeland, Mich.). "Detecting... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,587, issued on May 19, was assigned to United Arab Emirates University (Al Ain, United Arab Emirates). "Systems and methods for determining ... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,588, issued on May 19, was assigned to MITSUI KINZOKU COMPANY Ltd. (Japan) and KYUSHU UNIVERSITY NATIONAL UNIVERSITY Corp. (Japan). "Carbon ... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,589, issued on May 19, was assigned to The Board of Trustees of the University of Illinois (Urbana, Ill.). "Label free analyte detection by ... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,590, issued on May 19, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Semiconductor structure having biosen... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,591, issued on May 19, was assigned to NIKON Corp. (Tokyo). "Semiconductor device, electronic device, pH sensor, biosensor, method for manuf... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,592, issued on May 19, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Biomarker sensing structure" was invented by A... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,593, issued on May 19, was assigned to President and Fellows of Harvard College (Cambridge, Mass.). "Electrochemical measurement apparatuses... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,594, issued on May 19, was assigned to TDK Corp. (Tokyo). "Detection device" was invented by Takato Fukui (Tokyo) and Taiju Akushichi (Tokyo... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,595, issued on May 19, was assigned to Rosen IP AG (Stans, Switzerland). "Method for determining the geometry of a defect and for determinin... Read More